Jonathan Lang
Argonne National Lab
The advent of third generation synchrotron sources such as the Advanced Photon Source at Argonne National Lab has led to the development of many new types of x-ray measurements. Although the sensitivity of x-rays to an atom¹s magnetic moment is significantly smaller than to its charge, the high-flux, high-collimation, and unique polarization properties of synchrotron radiation have enabled x-rays to become a routine tool in the study of magnetic systems. Near certain resonances, x-ray measurements provide magnetic information specific to a particular species of atom, thereby offering key insights into the multiple interactions present in emerging complex magnetic materials. Furthermore, highly focused x-ray beams can be used to probe magnetic properties in sample environments such as high-pressure and high-field that can not easily be accessed via other techniques. This talk will describe how synchrotron x-rays can be applied in magnetic studies, and present some recent results probing interactions in applied nanostructured systems and more fundamental properties such as quantum phase transitions.
Friday, November 6, 2009 at 4:00 PM
Room L211, Technological Institute
Refreshments are served at 3:30 PM
