DEPARTMENT OF PHYSICS AND ASTRONOMY

Professor Bedzyk and his research group develop novel X-ray probes for atomic-scale characterization of surfaces, interfaces, ultra-thin-films and nanostructures. In addition to using an in-house X-ray lab, they make extensive use of synchrotron X-ray facilities, where there is greatly enhanced chemical and structural sensitivity for studying systems as dilute as one-hundredth of an atomic monolayer.

Awards and Honors

• Fellow, American Physical Society
• 1994 B. E. Warren Diffraction Physics Award, American Crystallographic Association

Selected Publications

• S. Kewalramani, G.I. Guerrero-Garcia, L.M. Moreau, J.W. Zwanikken, C.A. Mirkin, M. Olvera de la Cruz, M.J. Bedzyk, “Electrolyte-Mediated Assembly of Charged Nanoparticles”, ACS Central Sci2, 219-224  (2016)
• M. K. Tiwari, G. Das, M. J. Bedzyk, “X-ray standing wave analysis of nanostructures using partially coherent radiation”, Appl Phys Lett 107, (2015).
• J. D. Emery, B. Detlefs, H. J. Karmel, L. O. Nyakiti, D. K. Gaskill, M. C. Hersam, J. Zegenhagen, M. J. Bedzyk, “Chemically Resolved Interface Structure of Epitaxial Graphene on SiC(0001)”, Phys Rev Lett111, 215501 (2013).
• C. Y. Leung, L. C. Palmer, S. Kewalramani, B. F. Qiao, S. I. Stupp, M. Olvera de la Cruz, M. J. Bedzyk, “Crystalline polymorphism induced by charge regulation in ionic membranes”, Proc Nat Aca Sci 110, 16309-16314 (2013).
• Z. X. Feng, A. Kazimirov, M. J. Bedzyk, “Atomic Imaging of Oxide-Supported Metallic Nanocrystals”, ACS Nano5, 9755-9760 (2011).